L- and LCL-Filtered Grid-Tied Single-Phase Inverter Transistor Open-Circuit Fault Diagnosis Based on Post-Fault Reconfiguration Algorithms

This paper presents a transistor open-circuit fault diagnosis method based on an average model and post-fault reconfiguration algorithms for a grid-tied single-phase inverter that transfers power bi-directionally. The transistor open-circuit fault occurrence is detected by comparing the average brid...

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Veröffentlicht in:	IEEE transactions on power electronics Jg. 34; H. 10; S. 10180 - 10192
Hauptverfasser:	Li, Zhan, Wang, Borong, Ren, Yini, Wang, Jun, Bai, Zhihong, Ma, Hao
Format:	Journal Article
Sprache:	Englisch
Veröffentlicht:	New York IEEE 01.10.2019 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Schlagworte:	Algorithms Average model Circuit faults Circuits Embedded systems Fault detection Fault diagnosis grid-tied single-phase inverter Inverters Legged locomotion post-fault reconfiguration Reconfiguration Redundancy Sensors Transistors
ISSN:	0885-8993, 1941-0107
Online-Zugang:	Volltext
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