Multithreaded and Reconvergent Aware Algorithms for Accurate Digital Circuits Reliability Estimation

Until recently, reliability was not considered to be a major design concern for circuit designers, except in the case of space and mission critical applications. However, the aggressive scaling of CMOS devices has significantly affected their reliable operation. Several schemes have been used for mi...

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Veröffentlicht in:IEEE transactions on reliability Jg. 68; H. 2; S. 514 - 525
Hauptverfasser: Ibrahim, Walid, Ibrahim, Hazem
Format: Journal Article
Sprache:Englisch
Veröffentlicht: New York IEEE 01.06.2019
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN:0018-9529, 1558-1721
Online-Zugang:Volltext
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