Characterisation of multi-layered structures using a vector-based gradient descent algorithm at terahertz frequencies

Material characterisation and imaging applications using terahertz radiation have gained interest in the past few years due to their enormous potential for industrial applications. The availability of fast terahertz spectrometers or multi-pixel terahertz cameras has accelerated research in this doma...

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Vydané v:	Optics express Ročník 31; číslo 9; s. 15131
Hlavní autori:	Mukherjee, Amlan kusum, Wassmann, Sven, Wenzel, Konstantin, Globisch, Björn, Kohlhaas, Robert, Liebermeister, Lars, Preu, Sascha
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	United States 24.04.2023
ISSN:	1094-4087, 1094-4087
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