Detection of homogeneous production batches of semiconductor devices by greedy heuristic clustering algorithms with special distance metrics

Authors present a comparative efficiency analysis of application of k-means and k-medoids clustering models for solving the problem of grouping of semiconductor devices into homogeneous production batches using three types of metrics: Euclidean distance, Mahalanobis distance, Manhattan distance.

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Vydané v:	IOP conference series. Materials Science and Engineering Ročník 734; číslo 1; s. 12104 - 12108
Hlavní autori:	Shkaberina, G Sh, Rozhnov, I P, Popov, V P, Kazakovtsev, L A, Lapunova, E V
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	Bristol IOP Publishing 01.01.2020
Predmet:	Clustering Euclidean geometry Greedy algorithms Semiconductor devices
ISSN:	1757-8981, 1757-899X
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