Chen, W., Lo, S., Kao, S., Zan, H., Tsai, C., Lin, J., . . . Lee, C. (2011). Oxygen-Dependent Instability and Annealing/Passivation Effects in Amorphous In-Ga-Zn-O Thin-Film Transistors. IEEE electron device letters, 32(11), 1552-1554. https://doi.org/10.1109/LED.2011.2165694
Chicago-Zitierstil (17. Ausg.)Chen, Wei-Tsung, Shih-Yi Lo, Shih-Chin Kao, Hsiao-Wen Zan, Chuang-Chuang Tsai, Jian-Hong Lin, Chun-Hsiang Fang, und Chung-Chun Lee. "Oxygen-Dependent Instability and Annealing/Passivation Effects in Amorphous In-Ga-Zn-O Thin-Film Transistors." IEEE Electron Device Letters 32, no. 11 (2011): 1552-1554. https://doi.org/10.1109/LED.2011.2165694.
MLA-Zitierstil (9. Ausg.)Chen, Wei-Tsung, et al. "Oxygen-Dependent Instability and Annealing/Passivation Effects in Amorphous In-Ga-Zn-O Thin-Film Transistors." IEEE Electron Device Letters, vol. 32, no. 11, 2011, pp. 1552-1554, https://doi.org/10.1109/LED.2011.2165694.