Design of intelligent neuro-structures optimized with Levenberg–Marquardt and Bayesian distribution for dynamical analysis of Caputo–Fabrizio fractional electric circuit models

Electrical engineering models utilize interconnected circuits that consist of charged particles to enable the simulation and study of electric devices and systems, taking advantage of effective electron transfer across a completed circuit. Electric circuits involving the Caputo-Fabrizio (CF) fractio...

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Bibliographic Details

Published in:	Engineering applications of artificial intelligence Vol. 160; p. 111920
Main Authors:	Kausar, Aneela, Chang, Chuan-Yu, Naz, Sidra, Raja, Muhammad Asif Zahoor, Khan, Rooh Ullah, Safiullah, Muhammad, Naz, Saeeda
Format:	Journal Article
Language:	English
Published:	Elsevier Ltd 27.11.2025
Subjects:	Bayesian regularization Caputo-Fabrizio fractal operator Convergence stability test Electric circuits Levenberg–Marquardt Neural networks Wilcoxon signed-Rank test Electric circuits Neural networks Caputo-Fabrizio fractal operator Bayesian regularization Levenberg–Marquardt Wilcoxon signed-Rank test Convergence stability test
ISSN:	0952-1976
Online Access:	Get full text
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