An industrial process fault diagnosis method based on independent slow feature analysis and stacked sparse autoencoder network

Saved in:
Bibliographic Details
Published in:Journal of the Franklin Institute Vol. 361; no. 1; pp. 234 - 247
Main Authors: Li, Chang, Wen, Chenglin, Zhou, Zhe
Format: Journal Article
Language:English
Published: 01.01.2024
ISSN:0016-0032
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
ISSN:0016-0032
DOI:10.1016/j.jfranklin.2023.10.004