On the accuracy of permittivity profile inversion

An inversion accuracy improvement technique based on the two‐port network subject taken from the microwave theory is presented. The technique is dedicated to the one‐dimensional dielectric structure where the permittivity is a function of depth. Optimization and discretization procedures are part of...

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Vydáno v:Microwave and optical technology letters Ročník 63; číslo 11; s. 2728 - 2731
Hlavní autoři: Oweijane, Frederic, Ahmad, Falih
Médium: Journal Article
Jazyk:angličtina
Vydáno: Hoboken, USA John Wiley & Sons, Inc 01.11.2021
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Témata:
discretization
electromagnetic scattering
inverse problem
microwave theory
Optimization
Permittivity
profile reconstruction
ISSN:0895-2477, 1098-2760
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Shrnutí:An inversion accuracy improvement technique based on the two‐port network subject taken from the microwave theory is presented. The technique is dedicated to the one‐dimensional dielectric structure where the permittivity is a function of depth. Optimization and discretization procedures are part of this technique. Applicability and validity of the technique is demonstrated through numerical experiments.
Bibliografie:Frederic Oweijane is a student.
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ISSN:0895-2477
1098-2760
DOI:10.1002/mop.32951