On the accuracy of permittivity profile inversion
An inversion accuracy improvement technique based on the two‐port network subject taken from the microwave theory is presented. The technique is dedicated to the one‐dimensional dielectric structure where the permittivity is a function of depth. Optimization and discretization procedures are part of...
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| Vydané v: | Microwave and optical technology letters Ročník 63; číslo 11; s. 2728 - 2731 |
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| Hlavní autori: | , |
| Médium: | Journal Article |
| Jazyk: | English |
| Vydavateľské údaje: |
Hoboken, USA
John Wiley & Sons, Inc
01.11.2021
Wiley Subscription Services, Inc |
| Predmet: | |
| ISSN: | 0895-2477, 1098-2760 |
| On-line prístup: | Získať plný text |
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| Shrnutí: | An inversion accuracy improvement technique based on the two‐port network subject taken from the microwave theory is presented. The technique is dedicated to the one‐dimensional dielectric structure where the permittivity is a function of depth. Optimization and discretization procedures are part of this technique. Applicability and validity of the technique is demonstrated through numerical experiments. |
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| Bibliografia: | Frederic Oweijane is a student. ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
| ISSN: | 0895-2477 1098-2760 |
| DOI: | 10.1002/mop.32951 |