Data Driven In Situ TEM: A Path Towards Accurate Characterization of Radiation Damage in Structural Materials

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Bibliographic Details
Published in:	Microscopy and microanalysis Vol. 29; no. Supplement_1; p. 1555
Main Authors:	Burns, Kory, Kohnert, Caitlin, Li, Nan, Scott, Mary C, Hattar, Khalid
Format:	Journal Article
Language:	English
Published:	England 22.07.2023
ISSN:	1435-8115
Online Access:	Get more information
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ISSN:	1435-8115
DOI:	10.1093/micmic/ozad067.800