Full-Scale Regression Modeling of Spatial Details for Single-/Multiplatform Hypersharpening

Whenever the sharpening band is not unique, the hypersharpening paradigm extends traditional pansharpening to any <inline-formula> <tex-math notation="LaTeX">m </tex-math></inline-formula>-to-<inline-formula> <tex-math notation="LaTeX">n </t...

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Bibliographic Details
Published in:IEEE transactions on geoscience and remote sensing Vol. 63; pp. 1 - 16
Main Authors: Arienzo, Alberto, Garzelli, Andrea, Alparone, Luciano, Vivone, Gemine
Format: Journal Article
Language:English
Published: New York IEEE 2025
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:
ISSN:0196-2892, 1558-0644
Online Access:Get full text
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