Full-Scale Regression Modeling of Spatial Details for Single-/Multiplatform Hypersharpening
Whenever the sharpening band is not unique, the hypersharpening paradigm extends traditional pansharpening to any <inline-formula> <tex-math notation="LaTeX">m </tex-math></inline-formula>-to-<inline-formula> <tex-math notation="LaTeX">n </t...
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| Published in: | IEEE transactions on geoscience and remote sensing Vol. 63; pp. 1 - 16 |
|---|---|
| Main Authors: | , , , |
| Format: | Journal Article |
| Language: | English |
| Published: |
New York
IEEE
2025
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subjects: | |
| ISSN: | 0196-2892, 1558-0644 |
| Online Access: | Get full text |
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