Automatically Designing Network-Based Deep Transfer Learning Architectures Based on Genetic Algorithm for In-Situ Tool Condition Monitoring

In-situ tool condition monitoring ( in-situ TCM) is vital for metal removal manufacturing which realizes on-machine diagnosis in a real-time manner. The limitation of in-situ TCM based on traditional deep learning lies in several aspects: the requirement of sufficient labeled data of health conditio...

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Bibliographic Details
Published in:IEEE transactions on industrial electronics (1982) Vol. 69; no. 9; pp. 9483 - 9493
Main Authors: Liu, Yuekai, Yu, Yaoxiang, Guo, Liang, Gao, Hongli, Tan, Yongwen
Format: Journal Article
Language:English
Published: New York IEEE 01.09.2022
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN:0278-0046, 1557-9948
Online Access:Get full text
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