Automatically Designing Network-Based Deep Transfer Learning Architectures Based on Genetic Algorithm for In-Situ Tool Condition Monitoring
In-situ tool condition monitoring ( in-situ TCM) is vital for metal removal manufacturing which realizes on-machine diagnosis in a real-time manner. The limitation of in-situ TCM based on traditional deep learning lies in several aspects: the requirement of sufficient labeled data of health conditio...
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| Published in: | IEEE transactions on industrial electronics (1982) Vol. 69; no. 9; pp. 9483 - 9493 |
|---|---|
| Main Authors: | , , , , |
| Format: | Journal Article |
| Language: | English |
| Published: |
New York
IEEE
01.09.2022
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subjects: | |
| ISSN: | 0278-0046, 1557-9948 |
| Online Access: | Get full text |
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