A Metal Film Thickness Measurement System With a Large Range Based on High-Performance ME Sensors
The majority of traditional eddy current-based metal film thickness measurement systems measure the thickness of the metal film by detecting changes in the impedance or voltage of the detection coil, leading to limited measurement range and susceptibility to measurement errors caused by variations i...
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| Published in: | IEEE/ASME transactions on mechatronics pp. 1 - 10 |
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| Main Authors: | , , , , , , , , |
| Format: | Journal Article |
| Language: | English |
| Published: |
IEEE
2025
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| Subjects: | |
| ISSN: | 1083-4435, 1941-014X |
| Online Access: | Get full text |
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