Huang, H., Chae, C., Johnson, J. M., Senckowski, A., Sharma, S., Singisetti, U., . . . Hwang, J. (2023). Atomic-Level Insights into the Radiation Damage and Recovery of β-Ga2O3 for High-performance Semiconductors. Microscopy and microanalysis, 29(Supplement_1), 1472. https://doi.org/10.1093/micmic/ozad067.756
Citace podle Chicago (17th ed.)Huang, Hsien-Lien, Christopher Chae, Jared M. Johnson, Alexander Senckowski, Shivam Sharma, Uttam Singisetti, Man Hoi Wong, a Jinwoo Hwang. "Atomic-Level Insights into the Radiation Damage and Recovery of β-Ga2O3 for High-performance Semiconductors." Microscopy and Microanalysis 29, no. Supplement_1 (2023): 1472. https://doi.org/10.1093/micmic/ozad067.756.
Citace podle MLA (9th ed.)Huang, Hsien-Lien, et al. "Atomic-Level Insights into the Radiation Damage and Recovery of β-Ga2O3 for High-performance Semiconductors." Microscopy and Microanalysis, vol. 29, no. Supplement_1, 2023, p. 1472, https://doi.org/10.1093/micmic/ozad067.756.