X‐Ray Photoelectron Spectroscopy Investigations of the Surface Reaction Layer and its Effects on the Transformation Properties of Nanoscale Ti 51 Ni 38 Cu 11 Shape Memory Thin Films

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Bibliographic Details
Published in:Advanced engineering materials Vol. 17; no. 5; pp. 669 - 673
Main Authors: König, Dennis, Naujoks, Dennis, de los Arcos, Teresa, Grosse‐Kreul, Simon, Ludwig, Alfred
Format: Journal Article
Language:English
Published: 01.05.2015
ISSN:1438-1656, 1527-2648
Online Access:Get full text
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Description
ISSN:1438-1656
1527-2648
DOI:10.1002/adem.201400317