FUZYE: A Fuzzy -Means Analog IC Yield Optimization Using Evolutionary-Based Algorithms

This paper presents fuzzy c-means-based yield estimation (FUZYE), a methodology that reduces the time impact caused by Monte Carlo (MC) simulations in the context of analog integrated circuits (ICs) yield estimation, enabling it for yield optimization with population-based algorithms, e.g., the gene...

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Vydané v:	IEEE transactions on computer-aided design of integrated circuits and systems Ročník 39; číslo 1; s. 1 - 13
Hlavní autori:	Canelas, Antonio, Povoa, Ricardo, Martins, Ricardo, Lourenco, Nuno, Guilherme, Jorge, Carvalho, Joao Paulo, Horta, Nuno
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	New York IEEE 01.01.2020 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Predmet:	Algorithms Analog circuits analog IC yield estimation Analog integrated circuit (IC) synthesis Analytical models circuit optimization Clustering clustering algorithms Computer simulation Evolutionary algorithms expensive simulations Genetic algorithms Integrated circuit modeling Integrated circuits Monte Carlo (MC) analysis Optimization Population Simulation Sociology Statistics Yield estimation
ISSN:	0278-0070, 1937-4151
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