Call for Papers: Special Issue on AI, Machine Learning, and Deep Learning: Advances and Applications for EMC
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| Published in: | IEEE transactions on electromagnetic compatibility Vol. 65; no. 6; pp. 2070 - 2071 |
|---|---|
| Format: | Journal Article |
| Language: | English |
| Published: |
IEEE
01.12.2023
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| ISSN: | 0018-9375, 1558-187X |
| Online Access: | Get full text |
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| DOI | 10.1109/TEMC.2023.3332183 |
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| StartPage | 2070 |
| Title | Call for Papers: Special Issue on AI, Machine Learning, and Deep Learning: Advances and Applications for EMC |
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