55‐1: Invited Paper: Yield and manufacturing challenges for microLED micro‐displays

In this paper, we discuss microLED display yield and manufacturing challenges related to the CMOS integration as well as epi‐defectivity. Based on those considerations, we show the MICLEDI approach how to address them in a 300mm foundry compatible integration flow.

Bibliographic Details

Published in:	SID International Symposium Digest of technical papers Vol. 55; no. S1; pp. 481 - 483
Main Authors:	Steudel, Soeren, Vertommen, Johan, Bach, Lars
Format:	Journal Article
Language:	English
Published:	Campbell Wiley Subscription Services, Inc 01.04.2024
Subjects:	AR display Light emitting diodes Manufacturing microdisplay microLED
ISSN:	0097-966X, 2168-0159
Online Access:	Get full text
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