Proceedings : IEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes : June 26, 1999 Fort Collins, Colorado

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Bibliographic Details
Main Author: IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence
Format: Book
Language:English
Published: Los Alamitos, Calif IEEE Computer Society 1999
ISBN:0769501109, 9780769501109
Online Access:Get full text
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