Intelligence, I. C. S. T. C. o. P. A. a. M. (1999). Proceedings: IEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes : June 26, 1999 Fort Collins, Colorado. IEEE Computer Society.
Chicago Style (17th ed.) CitationIntelligence, IEEE Computer Society. Technical Committee on Pattern Analysis and Machine. Proceedings: IEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes : June 26, 1999 Fort Collins, Colorado. Los Alamitos, Calif: IEEE Computer Society, 1999.
MLA (9th ed.) CitationIntelligence, IEEE Computer Society. Technical Committee on Pattern Analysis and Machine. Proceedings: IEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes : June 26, 1999 Fort Collins, Colorado. IEEE Computer Society, 1999.
Warning: These citations may not always be 100% accurate.