Intelligence, I. C. S. T. C. o. P. A. a. M. (1999). Proceedings: IEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes : June 26, 1999 Fort Collins, Colorado. IEEE Computer Society.
Citace podle Chicago (17th ed.)Intelligence, IEEE Computer Society. Technical Committee on Pattern Analysis and Machine. Proceedings: IEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes : June 26, 1999 Fort Collins, Colorado. Los Alamitos, Calif: IEEE Computer Society, 1999.
Citace podle MLA (9th ed.)Intelligence, IEEE Computer Society. Technical Committee on Pattern Analysis and Machine. Proceedings: IEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes : June 26, 1999 Fort Collins, Colorado. IEEE Computer Society, 1999.
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