Deep Learning of Crystalline Defects from TEM images: A Solution for the Problem of" Never Enough Training Data"
Crystalline defects, such as line-like dislocations, play an important role for the performance and reliability of many metallic devices. Their interaction and evolution still poses a multitude of open questions to materials science and materials physics. In-situ TEM experiments can provide importan...
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| Vydáno v: | Machine learning: science and technology |
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| Médium: | Journal Article |
| Jazyk: | angličtina |
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IOP Publishing Ltd
12.07.2023
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| ISSN: | 2632-2153 |
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| Abstract | Crystalline defects, such as line-like dislocations, play an important role for the performance and reliability of many metallic devices. Their interaction and evolution still poses a multitude of open questions to materials science and materials physics. In-situ TEM experiments can provide important insights into how dislocations behave and move. During such experiments, the dislocation microstructure is captured in form of videos. The analysis of individual video frames can provide useful insights but is limited by the capabilities of automated identification, digitization, and quantitative extraction of the dislocations as curved objects. The vast amount of data also makes manual annotation very time consuming, thereby limiting the use of Deep Learning-based, automated image analysis and segmentation of the dislocation microstructure. In this work, a parametric model for generating synthetic training data for segmentation of dislocations is developed. Even though domain scientists might dismiss synthetic training images sometimes as too artificial, our findings show that they can result in superior performance, particularly regarding the generalizing of the Deep Learning models with respect to different microstructures and imaging conditions. Additionally, we propose an enhanced deep learning method optimized for segmenting overlapping or intersecting dislocation lines. Upon testing this framework on four distinct real datasets, we find that our synthetic training data are able to yield high-quality results also on real images-even more so if fine-tune on a few real images was done. Our approach demonstrates the potential of synthetic data in overcoming the limitations of manual annotation in TEM, paving the way for more efficient and accurate analysis of dislocation microstructures. Last but not least, segmenting such thin, curvilinear structures is a task that is ubiquitous in many fields, which makes our method a potential candidate for other applications as well. |
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| AbstractList | Crystalline defects, such as line-like dislocations, play an important role for the performance and reliability of many metallic devices. Their interaction and evolution still poses a multitude of open questions to materials science and materials physics. In-situ TEM experiments can provide important insights into how dislocations behave and move. During such experiments, the dislocation microstructure is captured in form of videos. The analysis of individual video frames can provide useful insights but is limited by the capabilities of automated identification, digitization, and quantitative extraction of the dislocations as curved objects. The vast amount of data also makes manual annotation very time consuming, thereby limiting the use of Deep Learning-based, automated image analysis and segmentation of the dislocation microstructure. In this work, a parametric model for generating synthetic training data for segmentation of dislocations is developed. Even though domain scientists might dismiss synthetic training images sometimes as too artificial, our findings show that they can result in superior performance, particularly regarding the generalizing of the Deep Learning models with respect to different microstructures and imaging conditions. Additionally, we propose an enhanced deep learning method optimized for segmenting overlapping or intersecting dislocation lines. Upon testing this framework on four distinct real datasets, we find that our synthetic training data are able to yield high-quality results also on real images-even more so if fine-tune on a few real images was done. Our approach demonstrates the potential of synthetic data in overcoming the limitations of manual annotation in TEM, paving the way for more efficient and accurate analysis of dislocation microstructures. Last but not least, segmenting such thin, curvilinear structures is a task that is ubiquitous in many fields, which makes our method a potential candidate for other applications as well. |
| Author | Legros, Marc Oliveros, Daniela Dlouhy, Antonin Sandfeld, Stefan Govind, Kishan |
| Author_xml | – sequence: 1 givenname: Kishan surname: Govind fullname: Govind, Kishan organization: Forschungszentrum Jülich GmbH | Centre de recherche de Jülich | Juelich Research Centre – sequence: 2 givenname: Daniela surname: Oliveros fullname: Oliveros, Daniela organization: Centre d'élaboration de matériaux et d'études structurales – sequence: 3 givenname: Antonin surname: Dlouhy fullname: Dlouhy, Antonin organization: Czech Academy of Sciences [Prague] – sequence: 4 givenname: Marc orcidid: 0000-0001-5830-0434 surname: Legros fullname: Legros, Marc organization: Centre d'élaboration de matériaux et d'études structurales – sequence: 5 givenname: Stefan orcidid: 0000-0001-9560-4728 surname: Sandfeld fullname: Sandfeld, Stefan organization: Forschungszentrum Jülich GmbH | Centre de recherche de Jülich | Juelich Research Centre |
| BackLink | https://hal.science/hal-04298752$$DView record in HAL |
| BookMark | eNotjktPwkAURidGExH5Ae5u2LkozqPTad0RQDGpj8Qu3DW3cAfGlA6ZFhL-PfWxOl_O4uS7YZeNb4ixO8Encao1f8Dw5Y4TqbiZ8ERJecEGsmckhVbXbNS235xzqYXSkg_Yfk60h5wwNK7ZgLcwC6e2w7p2DcGcLK26FmzwOygWr-B2uKH2Eabw6etD53wD1gfotgQfwVc17frEGN7oSAEWjT9stlAEdL_xOXY4vmVXFuuWRv8csuJpUcyWUf7-_DKb5hHqVESVsUannMxaoBUmiSu1Vv2seqm0tSKpDGZEwlJWpanEeFUllFkjVolGu1ZDdv-X3WJd7kP_O5xKj65cTvPyx_FYZqnR8ijUGU1eXqk |
| ContentType | Journal Article |
| Copyright | Distributed under a Creative Commons Attribution 4.0 International License |
| Copyright_xml | – notice: Distributed under a Creative Commons Attribution 4.0 International License |
| DBID | 1XC VOOES |
| DOI | 10.48550/arXiv.2307.06322 |
| DatabaseName | Hyper Article en Ligne (HAL) Hyper Article en Ligne (HAL) (Open Access) |
| DatabaseTitleList | |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Physics Computer Science |
| EISSN | 2632-2153 |
| ExternalDocumentID | oai:HAL:hal-04298752v1 |
| GroupedDBID | 1XC 88I ABHWH ABUWG ACHIP AEINN AFFHD AFKRA AKPSB ALMA_UNASSIGNED_HOLDINGS ARAPS AZQEC BENPR BGLVJ CCPQU CJUJL DWQXO EBS GNUQQ GROUPED_DOAJ HCIFZ IOP K7- M2P M~E N5L O3W OK1 PHGZM PHGZT PIMPY PQGLB VOOES |
| ID | FETCH-LOGICAL-a581-b7f7580e7d1af1764b3d31afb58035ff16b7a9ee1fe9b882a4cb6e9f71c65afd3 |
| IngestDate | Sat Nov 01 14:59:50 EDT 2025 |
| IsDoiOpenAccess | true |
| IsOpenAccess | true |
| IsPeerReviewed | true |
| IsScholarly | true |
| Keywords | dislocation deep learning Computer Vision and Pattern Recognition (cs.CV) FOS: Computer and information sciences data mining deep learning synthetic training data segmentation data mining transmission electron microscopy dislocation crystal defect segmentation FOS: Physical sciences Materials Science (cond-mat.mtrl-sci) crystal defect transmission electron microscopy synthetic training data |
| Language | English |
| License | Distributed under a Creative Commons Attribution 4.0 International License: http://creativecommons.org/licenses/by/4.0 |
| LinkModel | OpenURL |
| MergedId | FETCHMERGED-LOGICAL-a581-b7f7580e7d1af1764b3d31afb58035ff16b7a9ee1fe9b882a4cb6e9f71c65afd3 |
| ORCID | 0000-0001-9560-4728 0000-0001-5830-0434 |
| OpenAccessLink | http://dx.doi.org/10.48550/arXiv.2307.06322 |
| ParticipantIDs | hal_primary_oai_HAL_hal_04298752v1 |
| PublicationCentury | 2000 |
| PublicationDate | 2023-07-12 |
| PublicationDateYYYYMMDD | 2023-07-12 |
| PublicationDate_xml | – month: 07 year: 2023 text: 2023-07-12 day: 12 |
| PublicationDecade | 2020 |
| PublicationTitle | Machine learning: science and technology |
| PublicationYear | 2023 |
| Publisher | IOP Publishing Ltd |
| Publisher_xml | – name: IOP Publishing Ltd |
| SSID | ssj0002513520 |
| Score | 2.225091 |
| SecondaryResourceType | preprint |
| Snippet | Crystalline defects, such as line-like dislocations, play an important role for the performance and reliability of many metallic devices. Their interaction and... |
| SourceID | hal |
| SourceType | Open Access Repository |
| SubjectTerms | Computer Science Physics |
| Title | Deep Learning of Crystalline Defects from TEM images: A Solution for the Problem of" Never Enough Training Data" |
| URI | https://hal.science/hal-04298752 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVAON databaseName: DOAJ Directory of Open Access Journals databaseCode: DOA dateStart: 20200101 customDbUrl: isFulltext: true eissn: 2632-2153 dateEnd: 99991231 titleUrlDefault: https://www.doaj.org/ omitProxy: false ssIdentifier: ssj0002513520 providerName: Directory of Open Access Journals – providerCode: PRVIOP databaseName: Institute of Physics Journals Open Access databaseCode: O3W dateStart: 20200301 customDbUrl: isFulltext: true eissn: 2632-2153 dateEnd: 99991231 titleUrlDefault: http://iopscience.iop.org/ omitProxy: false ssIdentifier: ssj0002513520 providerName: IOP Publishing – providerCode: PRVHPJ databaseName: ROAD: Directory of Open Access Scholarly Resources databaseCode: M~E dateStart: 20200101 customDbUrl: isFulltext: true eissn: 2632-2153 dateEnd: 99991231 titleUrlDefault: https://road.issn.org omitProxy: false ssIdentifier: ssj0002513520 providerName: ISSN International Centre – providerCode: PRVPQU databaseName: Computer Science Database databaseCode: K7- dateStart: 20200301 customDbUrl: isFulltext: true eissn: 2632-2153 dateEnd: 99991231 titleUrlDefault: http://search.proquest.com/compscijour omitProxy: false ssIdentifier: ssj0002513520 providerName: ProQuest – providerCode: PRVPQU databaseName: ProQuest Central databaseCode: BENPR dateStart: 20200301 customDbUrl: isFulltext: true eissn: 2632-2153 dateEnd: 99991231 titleUrlDefault: https://www.proquest.com/central omitProxy: false ssIdentifier: ssj0002513520 providerName: ProQuest – providerCode: PRVPQU databaseName: Publicly Available Content Database databaseCode: PIMPY dateStart: 20200301 customDbUrl: isFulltext: true eissn: 2632-2153 dateEnd: 99991231 titleUrlDefault: http://search.proquest.com/publiccontent omitProxy: false ssIdentifier: ssj0002513520 providerName: ProQuest – providerCode: PRVPQU databaseName: Science Database databaseCode: M2P dateStart: 20200301 customDbUrl: isFulltext: true eissn: 2632-2153 dateEnd: 99991231 titleUrlDefault: https://search.proquest.com/sciencejournals omitProxy: false ssIdentifier: ssj0002513520 providerName: ProQuest |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwtV1db9MwFLWqARIvfAwQn5NVwRMKNB-OG96idaMTa1eJPPQtclJ7qxTSqt2q8cIv4kdybMdtBjyMB16syG2sKPfUPvf23HsJeSviImaJ4F7Jg9DTugsPrMj3BGN93OGHvFSm2QQfj_vTaTLpdH66XJhNxeu6f32dLP-rqTEHY-vU2X8w93ZRTOAaRscIs2O8leEHUi5d2VQjaD5cfQcFrAyfHEgr3zBZJdnR6P38GzaUtc1PdyGyrfRwYrvNYJF3QYD9cKMVIbXp65M1rSUAG80_gzbJHRmBpnQdKUxCtUsfMoLNP8L5n3Vcw0ZddTfoLWDPKi0bsUpAmwy_PUUG1eLKIiTVbZDnLWnReXPHCJZtRzUAE12rcucDn5xN2nE4p3CSZmPUJeY9UJXwb0eAqdCmD7jVdL4xMvcPYGHNa7hRbnuYfs0ng-P89GT85eanLY3iMD3FeCEqT5_ccO6CDXztOwFnid5DRz92ET0wRbDZ5q9z8xgff38IEJgLF7A3BCZ7RB40ngdNLWIek46s98lD19WDNpv8PrlnRMHl-glZaihRByW6ULQFJdpAiWooUUCJWih9oil1QKIAEgWQaAMkLNGlBkbUwog6GFENo-5Tkh0fZYdDr-nQgd9y3_cKruBu9iSf-UL5PI6KcBbissBkyJTy44KLREpfyaSAKyeisohlorhfxkyoWfiM7NWLWj4nNFZlICRjKkpmUVyKgmHviHoCq6geK8IXpIs3ly9tCZZcF0WHaXI9tzPMy9t86RW5vwPca7J3ubqSb8jdcnM5X68OTEzmwBj2F25Ef-E |
| linkProvider | ISSN International Centre |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Deep+Learning+of+Crystalline+Defects+from+TEM+images%3A+A+Solution+for+the+Problem+of%22+Never+Enough+Training+Data%22&rft.jtitle=Machine+learning%3A+science+and+technology&rft.au=Govind%2C+Kishan&rft.au=Oliveros%2C+Daniela&rft.au=Dlouhy%2C+Antonin&rft.au=Legros%2C+Marc&rft.date=2023-07-12&rft.pub=IOP+Publishing+Ltd&rft.eissn=2632-2153&rft_id=info:doi/10.48550%2FarXiv.2307.06322&rft.externalDBID=HAS_PDF_LINK&rft.externalDocID=oai%3AHAL%3Ahal-04298752v1 |