On the complexity of hazard-free circuits
The problem of constructing hazard-free Boolean circuits dates back to the 1940s and is an important problem in circuit design. Our main lower-bound result unconditionally shows the existence of functions whose circuit complexity is polynomially bounded while every hazard-free implementation is prov...
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| Vydané v: | arXiv.org |
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| Hlavní autori: | , , , , , |
| Médium: | Paper |
| Jazyk: | English |
| Vydavateľské údaje: |
Ithaca
Cornell University Library, arXiv.org
04.04.2018
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| Predmet: | |
| ISSN: | 2331-8422 |
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| Shrnutí: | The problem of constructing hazard-free Boolean circuits dates back to the 1940s and is an important problem in circuit design. Our main lower-bound result unconditionally shows the existence of functions whose circuit complexity is polynomially bounded while every hazard-free implementation is provably of exponential size. Previous lower bounds on the hazard-free complexity were only valid for depth 2 circuits. The same proof method yields that every subcubic implementation of Boolean matrix multiplication must have hazards. These results follow from a crucial structural insight: Hazard-free complexity is a natural generalization of monotone complexity to all (not necessarily monotone) Boolean functions. Thus, we can apply known monotone complexity lower bounds to find lower bounds on the hazard-free complexity. We also lift these methods from the monotone setting to prove exponential hazard-free complexity lower bounds for non-monotone functions. As our main upper-bound result we show how to efficiently convert a Boolean circuit into a bounded-bit hazard-free circuit with only a polynomially large blow-up in the number of gates. Previously, the best known method yielded exponentially large circuits in the worst case, so our algorithm gives an exponential improvement. As a side result we establish the NP-completeness of several hazard detection problems. |
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| Bibliografia: | SourceType-Working Papers-1 ObjectType-Working Paper/Pre-Print-1 content type line 50 |
| ISSN: | 2331-8422 |
| DOI: | 10.48550/arxiv.1711.01904 |