Observation of Rapid Exciton–Exciton Annihilation in Monolayer Molybdenum Disulfide

Monolayer MoS2 is a direct-gap two-dimensional semiconductor that exhibits strong electron–hole interactions, leading to the formation of stable excitons and trions. Here we report the existence of efficient exciton–exciton annihilation, a four-body interaction, in this material. Exciton–exciton ann...

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Veröffentlicht in:Nano letters Jg. 14; H. 10; S. 5625 - 5629
Hauptverfasser: Sun, Dezheng, Rao, Yi, Reider, Georg A, Chen, Gugang, You, Yumeng, Brézin, Louis, Harutyunyan, Avetik R, Heinz, Tony F
Format: Journal Article
Sprache:Englisch
Veröffentlicht: Washington, DC American Chemical Society 08.10.2014
Schlagworte:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Density
Electron states
Electron-hole interaction
Exact sciences and technology
Excitation
Excitons
Excitons and related phenomena
Molybdenum disulfide
Monolayers
Physics
Semiconductors
Trions
MoS2
transient absorption spectroscopy
exciton dynamics
exciton−exciton annihilation
Excitons
Semiconductor materials
Strong interactions
Monolayers
Electron interaction
Molybdenum
Trion
ISSN:1530-6984, 1530-6992, 1530-6992
Online-Zugang:Volltext
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Beschreibung
Zusammenfassung:Monolayer MoS2 is a direct-gap two-dimensional semiconductor that exhibits strong electron–hole interactions, leading to the formation of stable excitons and trions. Here we report the existence of efficient exciton–exciton annihilation, a four-body interaction, in this material. Exciton–exciton annihilation was identified experimentally in ultrafast transient absorption measurements through the emergence of a decay channel varying quadratically with exciton density. The rate of exciton–exciton annihilation was determined to be (4.3 ± 1.1) × 10–2 cm2/s at room temperature.
Bibliographie:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
SC0001085
ISSN:1530-6984
1530-6992
1530-6992
DOI:10.1021/nl5021975