Automatic functional test generation using the extended finite state machine model

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Bibliographic Details
Published in:	DAC 93: 30th ACM-IEEE Design Automation pp. 86 - 91
Main Authors:	Cheng, Kwang Ting, Krishnakumar, A. S.
Format:	Conference Proceeding
Language:	English
Published:	New York, NY, USA ACM 01.01.1993
Series:	ACM Conferences
Subjects:	Hardware > Hardware test > Test-pattern generation and fault simulation Hardware > Integrated circuits > Logic circuits Hardware > Integrated circuits > Logic circuits > Sequential circuits Mathematics of computing > Discrete mathematics > Graph theory > Graph algorithms Mathematics of computing > Discrete mathematics > Graph theory > Trees Software and its engineering > Software notations and tools > General programming languages > Language types Theory of computation > Formal languages and automata theory
ISBN:	9780897915779, 0897915771
Online Access:	Get full text
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