Automatic functional test generation using the extended finite state machine model

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Bibliographic Details
Published in:DAC 93: 30th ACM-IEEE Design Automation pp. 86 - 91
Main Authors: Cheng, Kwang Ting, Krishnakumar, A. S.
Format: Conference Proceeding
Language:English
Published: New York, NY, USA ACM 01.01.1993
Series:ACM Conferences
Subjects:
Hardware > Hardware test > Test-pattern generation and fault simulation
Hardware > Integrated circuits > Logic circuits
Hardware > Integrated circuits > Logic circuits > Sequential circuits
Mathematics of computing > Discrete mathematics > Graph theory > Graph algorithms
Mathematics of computing > Discrete mathematics > Graph theory > Trees
Software and its engineering > Software notations and tools > General programming languages > Language types
Theory of computation > Formal languages and automata theory
ISBN:9780897915779, 0897915771
Online Access:Get full text
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Bibliography:SourceType-Conference Papers & Proceedings-1
ObjectType-Conference Paper-1
content type line 25
ISBN:9780897915779
0897915771
DOI:10.1145/157485.164585