Automatic functional test generation using the extended finite state machine model

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Published in:DAC 93: 30th ACM-IEEE Design Automation pp. 86 - 91
Main Authors: Cheng, Kwang Ting, Krishnakumar, A. S.
Format: Conference Proceeding
Language:English
Published: New York, NY, USA ACM 01.01.1993
Series:ACM Conferences
Subjects:
Hardware > Hardware test > Test-pattern generation and fault simulation
Hardware > Integrated circuits > Logic circuits
Hardware > Integrated circuits > Logic circuits > Sequential circuits
Mathematics of computing > Discrete mathematics > Graph theory > Graph algorithms
Mathematics of computing > Discrete mathematics > Graph theory > Trees
Software and its engineering > Software notations and tools > General programming languages > Language types
Theory of computation > Formal languages and automata theory
ISBN:9780897915779, 0897915771
Online Access:Get full text
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Author Cheng, Kwang Ting
Krishnakumar, A. S.
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StartPage 86
SubjectTerms Hardware -- Hardware test -- Test-pattern generation and fault simulation
Hardware -- Integrated circuits -- Logic circuits
Hardware -- Integrated circuits -- Logic circuits -- Sequential circuits
Mathematics of computing -- Discrete mathematics -- Graph theory -- Graph algorithms
Mathematics of computing -- Discrete mathematics -- Graph theory -- Trees
Software and its engineering -- Software notations and tools -- General programming languages -- Language types
Theory of computation -- Formal languages and automata theory
Title Automatic functional test generation using the extended finite state machine model
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