Citace podle APA (7th ed.)

Cheng, K. T., & Krishnakumar, A. S. (1993, January). Automatic functional test generation using the extended finite state machine model. DAC 93: 30th ACM-IEEE Design Automation, 86-91. https://doi.org/10.1145/157485.164585

Citace podle Chicago (17th ed.)

Cheng, Kwang Ting, a A. S. Krishnakumar. "Automatic Functional Test Generation Using the Extended Finite State Machine Model." DAC 93: 30th ACM-IEEE Design Automation Jan. 1993: 86-91. https://doi.org/10.1145/157485.164585.

Citace podle MLA (9th ed.)

Cheng, Kwang Ting, a A. S. Krishnakumar. "Automatic Functional Test Generation Using the Extended Finite State Machine Model." DAC 93: 30th ACM-IEEE Design Automation, Jan. 1993, pp. 86-91, https://doi.org/10.1145/157485.164585.

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