APA (7th ed.) Citation

Cheng, K. T., & Krishnakumar, A. S. (1993, January). Automatic functional test generation using the extended finite state machine model. DAC 93: 30th ACM-IEEE Design Automation, 86-91. https://doi.org/10.1145/157485.164585

Chicago Style (17th ed.) Citation

Cheng, Kwang Ting, and A. S. Krishnakumar. "Automatic Functional Test Generation Using the Extended Finite State Machine Model." DAC 93: 30th ACM-IEEE Design Automation Jan. 1993: 86-91. https://doi.org/10.1145/157485.164585.

MLA (9th ed.) Citation

Cheng, Kwang Ting, and A. S. Krishnakumar. "Automatic Functional Test Generation Using the Extended Finite State Machine Model." DAC 93: 30th ACM-IEEE Design Automation, Jan. 1993, pp. 86-91, https://doi.org/10.1145/157485.164585.