BEC: Bit-Level Static Analysis for Reliability against Soft Errors

Soft errors are a type of transient digital signal corruption that occurs in digital hardware components such as the internal flip-flops of CPU pipelines, the register file, memory cells, and even internal communication buses. Soft errors are caused by environmental radioactivity, magnetic interfere...

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Bibliographic Details

Published in:	Proceedings / International Symposium on Code Generation and Optimization pp. 283 - 295
Main Authors:	Ko, Yousun, Burgstaller, Bernd
Format:	Conference Proceeding
Language:	English
Published:	IEEE 02.03.2024
Subjects:	abstract interpretation Computer architecture fault injection pruning Hardware instruction scheduling LLVM Registers reliability RISC-V Semantics soft errors Software Static analysis Transient analysis
ISSN:	2643-2838
Online Access:	Get full text
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