Reengineering legacy software products into software product line based on automatic variability analysis

In order to deliver the various and short time-to-market software products to customers, the paradigm of Software Product Line (SPL) represents a new endeavor to the software development. To migrate a family of legacy software products into SPL for effective reuse, one has to understand commonality...

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Veröffentlicht in:2011 33rd International Conference on Software Engineering (ICSE) S. 1114 - 1117
1. Verfasser: Xue, Yinxing
Format: Tagungsbericht
Sprache:Englisch
Veröffentlicht: New York, NY, USA ACM 21.05.2011
IEEE
Schriftenreihe:ACM Conferences
Schlagworte:
Cloning
Cognition
Feature extraction
Information retrieval
Java
legacy software
Semantics
Software
Software and its engineering > Software creation and management > Software post-development issues > Software reverse engineering
spl
variability analysis
spl
variability analysis
legacy software
ISBN:9781450304450, 1450304451
ISSN:0270-5257
Online-Zugang:Volltext
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Beschreibung
Zusammenfassung:In order to deliver the various and short time-to-market software products to customers, the paradigm of Software Product Line (SPL) represents a new endeavor to the software development. To migrate a family of legacy software products into SPL for effective reuse, one has to understand commonality and variability among existing products variants. The existing techniques rely on manual identification and modeling of variability, and the analysis based on those techniques is performed at several mutually independent levels of abstraction. We propose a sandwich approach that consolidates feature knowledge from top-down domain analysis with bottom-up analysis of code similarities in subject software products. Our proposed method integrates model differencing, clone detection, and information retrieval techniques, which can provide a systematic means to reengineer the legacy software products into SPL based on automatic variability analysis.
ISBN:9781450304450
1450304451
ISSN:0270-5257
DOI:10.1145/1985793.1986009