Specification Test Compaction for Analog Circuits and MEMS

Testing a non-digital integrated system against all of its specifications can be quite expensive due to the elaborate test application and measurement setup required.We propose to eliminate redundant tests by employing ε-SVM based statistical learning.Application of the proposed methodology to an op...

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Bibliographic Details
Published in:Design, Automation and Test in Europe pp. 164 - 169
Main Authors: Biswas, Sounil, Li, Peng, Blanton, R. D. (Shawn), Pileggi, Larry T.
Format: Conference Proceeding
Language:English
Published: Washington, DC, USA IEEE Computer Society 07.03.2005
IEEE
Series:ACM Conferences
Subjects:
Accelerometers
Analog circuits
Circuit testing
Compaction
Computing methodologies > Machine learning > Learning paradigms
Computing methodologies > Machine learning > Machine learning approaches > Markov decision processes
Costs
Hardware > Emerging technologies
Hardware > Hardware test
Hardware > Robustness
Hardware > Very large scale integration design
Integrated circuit measurements
Micromechanical devices
Operational amplifiers
Statistical learning
System testing
Theory of computation > Theory and algorithms for application domains > Machine learning theory > Markov decision processes
ISBN:9780769522883, 0769522882
ISSN:1530-1591
Online Access:Get full text
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Summary:Testing a non-digital integrated system against all of its specifications can be quite expensive due to the elaborate test application and measurement setup required.We propose to eliminate redundant tests by employing ε-SVM based statistical learning.Application of the proposed methodology to an operational amplifier and a MEMS accelerometer reveal that redundant tests can be statistically identified from a complete set of specification-based tests with negligible error. Specifically, after eliminating five of eleven specification-based tests for an operational amplifier, the defect escape and yield loss is small at 0.6% and 0.9%, respectively.For the accelerometer, defect escape of 0.2% and yield loss of 0.1% occurs when the hot and colt tests are eliminated.For the accelerometer, this level of Compaction would reduce test cost by more than half.
Bibliography:SourceType-Conference Papers & Proceedings-1
ObjectType-Conference Paper-1
content type line 25
ISBN:9780769522883
0769522882
ISSN:1530-1591
DOI:10.1109/DATE.2005.277