On the Analysis of Reed Solomon Coding for Resilience to Transient/Permanent Faults in Highly Reliable Memories
Single Event Upsets (SEU) as well as permanent faults can significantly affect the correct on-line operation of digital systems, such as memories and microprocessors; a memory can be made resilient to permanent and transient faults by using modular redundancy and coding. In this paper, different mem...
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| Published in: | Design, Automation and Test in Europe pp. 580 - 585 |
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| Main Authors: | , , , , |
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Washington, DC, USA
IEEE Computer Society
07.03.2005
IEEE |
| Series: | ACM Conferences |
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| ISBN: | 9780769522883, 0769522882 |
| ISSN: | 1530-1591 |
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| Abstract | Single Event Upsets (SEU) as well as permanent faults can significantly affect the correct on-line operation of digital systems, such as memories and microprocessors; a memory can be made resilient to permanent and transient faults by using modular redundancy and coding. In this paper, different memory systems are compared: these systems utilize simplex and duplex arrangements with a combination of Reed Solomon coding and scrubbing. The memory systems and their operations are analyzed by novel Markov chains to characterize performance for dynamic reconfiguration as well as error detection and correction under the occurrence of permanent and transient faults. For a specific Reed Solomon code, the duplex arrangement allows to efficiently cope with the occurrence of permanent faults, while the use of scrubbing allows to cope with transient faults. |
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| AbstractList | Single Event Upsets (SEU) as well as permanent faults can significantly affect the correct on-line operation of digital systems, such as memories and microprocessors; a memory can be made resilient to permanent and transient faults by using modular redundancy and coding. In this paper, different memory systems are compared: these systems utilize simplex and duplex arrangements with a combination of Reed Solomon coding and scrubbing. The memory systems and their operations are analyzed by novel Markov chains to characterize performance for dynamic reconfiguration as well as error detection and correction under the occurrence of permanent and transient faults. For a specific Reed Solomon code, the duplex arrangement allows to efficiently cope with the occurrence of permanent faults, while the use of scrubbing allows to cope with transient faults. Single event upsets (SEU), as well as permanent faults, can significantly affect the correct on-line operation of digital systems, such as memories and microprocessors; a memory can be made resilient to permanent and transient faults by using modular redundancy and coding. Different memory systems are compared; these systems utilize simplex and duplex arrangements with a combination of Reed Solomon coding and scrubbing. The memory systems and their operations are analyzed by novel Markov chains to characterize the performance for dynamic reconfiguration as well as error detection and correction under the occurrence of permanent and transient faults. For a specific Reed Solomon code, the duplex arrangement is able to cope efficiently with the occurrence of permanent faults, while the use of scrubbing allows it to cope with transient faults. |
| Author | Schiano, L. Pontarelli, S. Ottavi, M. Salsano, A. Lombardi, F. |
| Author_xml | – sequence: 1 givenname: L. surname: Schiano fullname: Schiano, L. organization: Northeastern University, Boston, MA – sequence: 2 givenname: M. surname: Ottavi fullname: Ottavi, M. organization: Northeastern University, Boston, MA – sequence: 3 givenname: F. surname: Lombardi fullname: Lombardi, F. organization: Northeastern University, Boston, MA – sequence: 4 givenname: S. surname: Pontarelli fullname: Pontarelli, S. organization: University of Rome "Tor Vergata", Rome, Italy – sequence: 5 givenname: A. surname: Salsano fullname: Salsano, A. organization: University of Rome "Tor Vergata", Rome, Italy |
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| Keywords | Reliability Evaluation High Reliability Systems Scrubbing Reed-Solomon Codes Dynamic Redundancy |
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| Snippet | Single Event Upsets (SEU) as well as permanent faults can significantly affect the correct on-line operation of digital systems, such as memories and... Single event upsets (SEU), as well as permanent faults, can significantly affect the correct on-line operation of digital systems, such as memories and... |
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| StartPage | 580 |
| SubjectTerms | Digital systems Dynamic Redundancy Error correction Fault detection Hardware -- Hardware test Hardware -- Integrated circuits -- Semiconductor memory -- Dynamic memory Hardware -- Robustness High Reliability Systems Mathematics of computing -- Information theory Mathematics of computing -- Information theory -- Coding theory Mathematics of computing -- Probability and statistics -- Probabilistic representations -- Markov networks Mathematics of computing -- Probability and statistics -- Stochastic processes -- Markov processes Microprocessors Performance analysis Redundancy Reed-Solomon codes Reliability Evaluation Resilience Scrubbing Security and privacy -- Cryptography -- Mathematical foundations of cryptography Single event upset Theory of computation -- Theory and algorithms for application domains -- Machine learning theory -- Markov decision processes Transient analysis |
| Title | On the Analysis of Reed Solomon Coding for Resilience to Transient/Permanent Faults in Highly Reliable Memories |
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