Defect Aware Test Patterns

A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The proposed method can be used with any test generation procedure to improve the effectiveness of the tests in detecting un-modeled...

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Vydané v:Design, Automation and Test in Europe s. 450 - 455
Hlavní autori: Tang, Huaxing, Chen, Gang, Reddy, Sudhakar M., Wang, Chen, Rajski, Janusz, Pomeranz, Irith
Médium: Konferenčný príspevok..
Jazyk:English
Vydavateľské údaje: Washington, DC, USA IEEE Computer Society 07.03.2005
IEEE
Edícia:ACM Conferences
Predmet:
Automatic testing
Design automation
Europe
Hardware > Hardware test
Hardware > Hardware validation > Functional verification
Hardware > Robustness
Hardware > Very large scale integration design
Mathematics of computing > Probability and statistics > Statistical paradigms
Mathematics of computing > Probability and statistics > Statistical paradigms > Statistical graphics
ISBN:9780769522883, 0769522882
ISSN:1530-1591
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Shrnutí:A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The proposed method can be used with any test generation procedure to improve the effectiveness of the tests in detecting un-modeled defects. Experimental results on several industrial designs show the effectiveness of defect aware tests. We also propose a measure to estimate the effectiveness of given test sets in detecting un-modeled defects.
Bibliografia:SourceType-Conference Papers & Proceedings-1
ObjectType-Conference Paper-1
content type line 25
ISBN:9780769522883
0769522882
ISSN:1530-1591
DOI:10.1109/DATE.2005.110