ICCAD-2012 CAD contest in fuzzy pattern matching for physical verification and benchmark suite
With the widespread adoption of design for manufacturing techniques and design and process co-optimization as well as the increase in the complexity of the processes to manufacture integrated circuits there is pressing need in finding quickly to calibrate yet accurate and high performing methods to...
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| Published in: | 2012 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) pp. 349 - 350 |
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| Main Author: | |
| Format: | Conference Proceeding |
| Language: | English |
| Published: |
New York, NY, USA
ACM
05.11.2012
IEEE |
| Series: | ACM Conferences |
| Subjects: | |
| ISBN: | 9781450315739, 1450315739 |
| ISSN: | 1092-3152 |
| Online Access: | Get full text |
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