ICCAD-2012 CAD contest in fuzzy pattern matching for physical verification and benchmark suite

With the widespread adoption of design for manufacturing techniques and design and process co-optimization as well as the increase in the complexity of the processes to manufacture integrated circuits there is pressing need in finding quickly to calibrate yet accurate and high performing methods to...

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Bibliographic Details
Published in:2012 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) pp. 349 - 350
Main Author: Torres, J. Andres
Format: Conference Proceeding
Language:English
Published: New York, NY, USA ACM 05.11.2012
IEEE
Series:ACM Conferences
Subjects:
Accuracy
Applied computing > Arts and humanities > Architecture (buildings) > Computer-aided design
Applied computing > Physical sciences and engineering > Engineering > Computer-aided design
circuits
Classification algorithms
Computational geometry
Computing methodologies > Artificial intelligence > Knowledge representation and reasoning > Probabilistic reasoning
Computing methodologies > Artificial intelligence > Knowledge representation and reasoning > Vagueness and fuzzy logic
Data systems
Design automation
fuzzy sets
Hardware > Hardware validation > Functional verification
Integrated circuit modeling
Layout
nanoscale devices
Pattern matching
Solid modeling
classification algorithms
computational geometry
fuzzy sets
circuits
data systems
nanoscale devices
ISBN:9781450315739, 1450315739
ISSN:1092-3152
Online Access:Get full text
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Summary:With the widespread adoption of design for manufacturing techniques and design and process co-optimization as well as the increase in the complexity of the processes to manufacture integrated circuits there is pressing need in finding quickly to calibrate yet accurate and high performing methods to identify layout topologies which may cause yield loss. While full-based simulations provide the most accurate prediction possible their runtime prohibits an adoption at all levels of the design flow. Alternative traditional rule checking including pattern matching techniques are fast but have a limited application in finding locations that were not part the training set. Several approaches to improve the accuracy of the prediction to reduce the number of miss structures and false detections have been proposed, but none have yielded and acceptable tradeoff between accuracy and runtime. This contest is aimed to provide a suite of layouts which highlight the challenges of this application: Widely different classes, limited amount of data and low prediction rates.
ISBN:9781450315739
1450315739
ISSN:1092-3152
DOI:10.1145/2429384.2429457