APA (7th ed.) Citation

Stratigopoulos, H., Faubet, P., Courant, Y., & Mohamed, F. (2013, May 29). Multidimensional analog test metrics estimation using extreme value theory and statistical blockade. 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC), 1-7. https://doi.org/10.1145/2463209.2488822

Chicago Style (17th ed.) Citation

Stratigopoulos, Haralampos-G, Pierre Faubet, Yoann Courant, and Firas Mohamed. "Multidimensional Analog Test Metrics Estimation Using Extreme Value Theory and Statistical Blockade." 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC) 29 May. 2013: 1-7. https://doi.org/10.1145/2463209.2488822.

MLA (9th ed.) Citation

Stratigopoulos, Haralampos-G, et al. "Multidimensional Analog Test Metrics Estimation Using Extreme Value Theory and Statistical Blockade." 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC), 29 May. 2013, pp. 1-7, https://doi.org/10.1145/2463209.2488822.