Multidimensional analog test metrics estimation using extreme value theory and statistical blockade

The high cost of testing certain analog, mixed-signal, and RF circuits has driven in the recent years the development of alternative low-cost tests to replace the most costly or even all standard specification tests. However, there is a lack of solutions for evaluating the parametric test error, tha...

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Bibliographic Details
Published in:2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC) pp. 1 - 7
Main Authors: Stratigopoulos, Haralampos-G., Faubet, Pierre, Courant, Yoann, Mohamed, Firas
Format: Conference Proceeding
Language:English
Published: New York, NY, USA ACM 29.05.2013
IEEE
Series:ACM Conferences
Subjects:
Analog/mixed-signal/RF IC testing
extreme value theory
Hardware > Electronic design automation > Physical design (EDA)
Hardware > Hardware test
Hardware > Robustness
Integrated circuit modeling
Mathematics of computing > Probability and statistics > Statistical paradigms
Mathematics of computing > Probability and statistics > Statistical paradigms > Statistical graphics
Maximum likelihood estimation
Measurement
Monte Carlo methods
statistical blockade
test metrics
Testing
test metrics
statistical blockade
analog/mixed-signal/RF IC testing
extreme value theory
ISBN:1450320716, 9781450320719
ISSN:0738-100X
Online Access:Get full text
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Summary:The high cost of testing certain analog, mixed-signal, and RF circuits has driven in the recent years the development of alternative low-cost tests to replace the most costly or even all standard specification tests. However, there is a lack of solutions for evaluating the parametric test error, that is, the test error for circuits with process variations, resulting from this replacement. For this reason, test engineers are often reluctant to adopt alternative tests since it is not guaranteed that test cost reduction is not achieved at the expense of sacrificing test quality. In this paper, we present a technique to estimate the parametric test error fast and reliably with parts per million accuracy. The technique is based on extreme value theory and statistical blockade. Relying on a small number of targeted simulations, it is capable of providing accurate estimates of parametric test error in the general scenario where a set of alternative tests replaces all or a subset of standard specification tests.
ISBN:1450320716
9781450320719
ISSN:0738-100X
DOI:10.1145/2463209.2488822