APA (7th ed.) Citation

Jacome, M., He, C., de Veciana, G., & Bijansky, S. (2004, June 7). Defect tolerant probabilistic design paradigm for nanotechnologies. Proceedings - ACM IEEE Design Automation Conference, 596-601. https://doi.org/10.1145/996566.996730

Chicago Style (17th ed.) Citation

Jacome, Margarida, Chen He, Gustavo de Veciana, and Stephen Bijansky. "Defect Tolerant Probabilistic Design Paradigm for Nanotechnologies." Proceedings - ACM IEEE Design Automation Conference 7 Jun. 2004: 596-601. https://doi.org/10.1145/996566.996730.

MLA (9th ed.) Citation

Jacome, Margarida, et al. "Defect Tolerant Probabilistic Design Paradigm for Nanotechnologies." Proceedings - ACM IEEE Design Automation Conference, 7 Jun. 2004, pp. 596-601, https://doi.org/10.1145/996566.996730.