Combining deterministic and genetic approaches for sequential circuit test generation

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Bibliographic Details
Published in:	Proceedings of the 32nd annual ACM/IEEE Design Automation Conference pp. 183 - 188
Main Authors:	Rudnick, Elizabeth M., Patel, Janak H.
Format:	Conference Proceeding
Language:	English
Published:	New York, NY, USA ACM 01.01.1995
Series:	ACM Conferences
Subjects:	Hardware > Hardware test > Test-pattern generation and fault simulation Hardware > Integrated circuits > Logic circuits > Sequential circuits
ISBN:	0897917251, 9780897917254
Online Access:	Get full text
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