Fast and exact simultaneous gate and wire sizing by Lagrangian relaxation

This paper considers simultaneous gate and wire sizing for general VLSI circuits under the Elmore delay model. We present a fast and exact algorithm which can minimize total area subject to maximum delay bound. The algorithm can be easily modified to give exact algorithms for optimizing several othe...

Celý popis

Uložené v:
Podrobná bibliografia
Vydané v:Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design s. 617 - 624
Hlavní autori: Chen, Chung-Ping, Chu, Chris C. N., Wong, D. F.
Médium: Konferenčný príspevok.. Journal Article
Jazyk:English
Vydavateľské údaje: New York, NY, USA ACM 1998
Edícia:ACM Conferences
Predmet:
Applied computing > Physical sciences and engineering > Engineering
Hardware > Very large scale integration design
Mathematics of computing > Mathematical software
ISBN:1581130082, 9781581130089
ISSN:1092-3152
On-line prístup:Získať plný text
Tagy: Pridať tag
Žiadne tagy, Buďte prvý, kto otaguje tento záznam!
Popis
Shrnutí:This paper considers simultaneous gate and wire sizing for general VLSI circuits under the Elmore delay model. We present a fast and exact algorithm which can minimize total area subject to maximum delay bound. The algorithm can be easily modified to give exact algorithms for optimizing several other objectives (e.g. minimizing maximum delay or minimizing total area subject to arrival time specifications at all inputs and outputs). No previous algorithm for simultaneous gate and wire sizing can guarantee exact solutions for general circuits. Our algorithm is an iterative one with a guarantee on convergence to global optimal solutions. It is based on Lagrangian relaxation and `one-gate/wire-at-a-time' local optimizations, and is extremely economical and fast. For example, we can optimize a circuit with 27,648 gates and wires in about 36 minutes using under 23 MB memory on an IBM RS/6000 workstation.
Bibliografia:SourceType-Scholarly Journals-2
ObjectType-Feature-2
ObjectType-Conference Paper-1
content type line 23
SourceType-Conference Papers & Proceedings-1
ObjectType-Article-3
ISBN:1581130082
9781581130089
ISSN:1092-3152
DOI:10.1145/288548.289097