Citace podle APA (7th ed.)

Polian, I., Becker, B., & Reddy, S. M. (2003, March 3). Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST. Design, Automation, and Test in Europe: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1; 03-07 Mar. 2003, 11184. https://doi.org/10.5555/789083.1022911

Citace podle Chicago (17th ed.)

Polian, Ilia, Bernd Becker, a Sudhakar M. Reddy. "Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST." Design, Automation, and Test in Europe: Proceedings of the Conference on Design, Automation and Test in Europe - Volume 1; 03-07 Mar. 2003 3 Mar. 2003: 11184. https://doi.org/10.5555/789083.1022911.

Citace podle MLA (9th ed.)

Polian, Ilia, et al. "Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST." Design, Automation, and Test in Europe: Proceedings of the Conference on Design, Automation and Test in Europe - Volume 1; 03-07 Mar. 2003, 3 Mar. 2003, p. 11184, https://doi.org/10.5555/789083.1022911.

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