Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST

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Veröffentlicht in:Design, Automation, and Test in Europe: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1; 03-07 Mar. 2003 S. 11184
Hauptverfasser: Polian, Ilia, Becker, Bernd, Reddy, Sudhakar M.
Format: Tagungsbericht
Sprache:Englisch
Veröffentlicht: Washington, DC, USA IEEE Computer Society 03.03.2003
Schriftenreihe:ACM Conferences
Schlagworte:
Hardware > Hardware test
Hardware > Robustness
Mathematics of computing > Probability and statistics > Probabilistic representations > Markov networks
Mathematics of computing > Probability and statistics > Stochastic processes > Markov processes
Theory of computation > Formal languages and automata theory
Theory of computation > Theory and algorithms for application domains > Machine learning theory > Markov decision processes
ISBN:0769518702, 9780769518701
ISSN:1530-1591
Online-Zugang:Volltext
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Bibliographie:SourceType-Conference Papers & Proceedings-1
ObjectType-Conference Paper-1
content type line 25
ISBN:0769518702
9780769518701
ISSN:1530-1591
DOI:10.5555/789083.1022911