PastATPG: A Hybrid ATPG Framework for Better Test Compaction with Partial Assignment SAT

In automatic test pattern generation (ATPG), SAT-based methods are typically used to complement structural approaches, especially for addressing hard-to-detect faults. However, as the size and complexity of circuits grow, SAT-based ATPG faces challenges like pattern inflation and excessive runtime,...

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Veröffentlicht in:	2025 62nd ACM/IEEE Design Automation Conference (DAC) S. 1 - 7
Hauptverfasser:	Chao, Zhiteng, Zhang, Xindi, Zhang, Xinyu, Mu, Jianan, Liu, Zizhen, Liang, Shengwen, Cai, Shaowei, Ye, Jing, Li, Xiaowei, Li, Huawei
Format:	Tagungsbericht
Sprache:	Englisch
Veröffentlicht:	IEEE 22.06.2025
Schlagworte:	Automatic test pattern generation Circuit faults Codes Compaction Complexity theory Design automation Faces Hybrid power systems Limiting Runtime
Online-Zugang:	Volltext
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