PastATPG: A Hybrid ATPG Framework for Better Test Compaction with Partial Assignment SAT

In automatic test pattern generation (ATPG), SAT-based methods are typically used to complement structural approaches, especially for addressing hard-to-detect faults. However, as the size and complexity of circuits grow, SAT-based ATPG faces challenges like pattern inflation and excessive runtime,...

Full description

Bibliographic Details

Published in:	2025 62nd ACM/IEEE Design Automation Conference (DAC) pp. 1 - 7
Main Authors:	Chao, Zhiteng, Zhang, Xindi, Zhang, Xinyu, Mu, Jianan, Liu, Zizhen, Liang, Shengwen, Cai, Shaowei, Ye, Jing, Li, Xiaowei, Li, Huawei
Format:	Conference Proceeding
Language:	English
Published:	IEEE 22.06.2025
Subjects:	Automatic test pattern generation Circuit faults Codes Compaction Complexity theory Design automation Faces Hybrid power systems Limiting Runtime
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!