Proceedings of the Second IEEE Workshop on Applications of Computer Vision, December 5-7, 1994, Sarasota, Florida

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Bibliographic Details
Main Authors: IEEE Workshop on Applications of Computer Vision, IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis
Format: Book
Language:English
Published: Los Alamitos, Calif IEEE Computer Society Press 1994
Subjects:
Computer vision > Congresses
ISBN:9780818664106, 081866410X
Online Access:Get full text
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Description
Bibliography:"IEEE catalog number 94TH06742"--T.p. verso
Includes bibliographical references and index
ISBN:9780818664106
081866410X