Chung, D. D. L. (1993). X-ray diffraction at elevated temperatures. A method for in situ process analysis ([1st ed.].). VCH Publishers.
Chicago-Zitierstil (17. Ausg.)Chung, Deborah D. L. X-ray Diffraction at Elevated Temperatures. A Method for in Situ Process Analysis. [1st ed.]. New York: VCH Publishers, 1993.
MLA-Zitierstil (9. Ausg.)Chung, Deborah D. L. X-ray Diffraction at Elevated Temperatures. A Method for in Situ Process Analysis. [1st ed.]. VCH Publishers, 1993.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.