X-ray diffraction at elevated temperatures. A method for in situ process analysis /
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| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York :
VCH Publishers,
1993
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| Edition: | [1st ed.] |
| Subjects: | |
| ISBN: | 0895737450 |
| Online Access: |
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Internet
CVTI sklad absenčný
| Call Number: |
A547511 |
|---|---|
| Copy | On Shelf |