Hot-carrier effects in MOS devices /

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Bibliographic Details
Main Author: Takeda, Eiji
Other Authors: Yang, Cary Y., Miura-Hamada, Akemi
Format: Book
Language:English
Published: San Diego : Academic Press, 1995
Edition:[1st ed.]
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ISBN:0126822409
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CVTI sklad absenčný

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Call Number: A556140
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